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> Lorlin impact semiconductor test system 2000V
Lorlin impact semiconductor test system 2000V
Lorlin Test Systems Double Impact Tester with:
high power mainframe source HVS-201 (2000 volts)
high power manual test station OTS-201 (2000 volts)
This system will test your discrete component devices such as;
transistors, diodes, igbts, diodes, fets, scrs, triacs, optos, small
signal and power discrete devices.
PC Software, manuals, test fixtures, SPARE BOARDS
From the OEM site: Lorlin is a Manufacturer of Automatic Discrete Component Semiconductor
Test Systems High Speed Production Test Systems for Transistors, Diodes, Zeners, Fets, IGBT, SCR,
Triac, Opto, Small Signal, and Power Semiconductors, High Power / High Current Lorlin offers the
highest quality, accuracy to the femtoamp level and is well known for the repeatability in measurements
of semiconductor devices. Leakage current, Breakdown voltage, gain, saturation, and a offers over 100
parameters in our extensive test library. Export test data to Excel or use our statistical analysis and high
rel software for maximum data readouts.
